| Comments |
"A schematic 3D representation of focal volumes is shown
for the indicated emission maxima." "Abbreviations used in this paper: 3D-SIM, three-dimensional SIM APD,
avalanche photodiode CCD, charge-coupled device CLSM, confocal laser
scanning microscopy CMOS, complementary metal oxide semiconductor
CW-STED, continuous-wave STED FPALM, fluorescence photoactivation
localization microscopy PALM photoactivated localization microscopy PMT,
photomultiplier tube PSF, point-spread-function SSIM, saturated SIM STED,
stimulated emission depletion STORM, stochastic optical reconstruction
microscopy SIM, structured illumination microscopy TIRF, total internal reflection
of fluorescence." See note beneath table |