| Range |
no bud scar ≈67%: one bud scar 14%: two bud scars 12%: three to seven bud scars <6% %
|
| Organism |
Budding yeast Saccharomyces cerevisiae |
| Reference |
Uchida M, Sun Y, McDermott G, Knoechel C, Le Gros MA, Parkinson D, Drubin DG, Larabell CA. Quantitative analysis of yeast internal architecture using soft X-ray tomography. Yeast. 2011 Mar28(3):227-36. doi: 10.1002/yea.1834. p.232 right columnPubMed ID21360734
|
| Method |
Abstract: "[Researchers] used soft X-ray tomography (SXT) a high-resolution, quantitative imaging technique to measure cell size and organelle volumes in yeasts." P.232 left column bottom paragraph: "To better understand cell size control and organelle inheritance during bud emergence and formation of the daughter cell, [researchers] measured cell and organelle volumes in daughter and mother cells separately. The bud scar(s) on the cell surface was
readily identified (an example of bud scars is shown in the supporting information, Figure S2)." |
| Comments |
P.232 right column: "In this study, about 67% of cells had no bud scar, 14%
of cells had one bud scar, 12% of cells had two bud scars, and <6% of cells had three to seven bud scars." |
| Entered by |
Uri M |
| ID |
110470 |