Cell membrane and wall combined thickness
| Value | 180 nm Range: 150-200 nm |
|---|---|
| Organism | Budding yeast Saccharomyces cerevisiae |
| Reference | M Milani et al, Differential Two Colour X-Ray Radiobiology of Membrane/Cytoplasm Yeast Cells, TMR Large-Scale Facilities Access Programme Technical report January 1998 University of Milan, Italy Table - link |
| Method | In order to precisely characterise their morphological structure before irradiation (hence allowing a precise dosimetry), yeast cells have been analysed with different experimental techniques including: optical microscopy, TEM, X-ray microscopy and Coulter Counter. Researchers wanted to measure the cell average radius ro, the total membrane and wall thickness DS, and the nucleus radius rN. |
| Entered by | Uri M |
| ID | 103951 |